... and crack tip displacements in the vicinity of atomically sharp edge cracks in polycrystalline silicon MEMS scale specimens were measured via an in situ atomic force microscopy/digital image correlation method. The effective (macroscopic) mode-I critical stress intensity factor for specimens from different...

... by dislocation event and occurs in nanoparticles or bulk single crystals deformed by atomic force microscopy or small nanoindenter forces. For the second instability event, this involves larger scale nanocontacts into single crystals or their films wherein multiple dislocations cooperate to form a large...

.... This means that frictional strengths derived from JKR analyses are about 50% higher than the actual values. Contact radii from classical contact mechanics and finite element analyses of an IFM probing of an OTS monolayer 24 05 2004 24 11 2004 self-assembly atomic force...

...-assembled monolayers. A new biaxial loading device was used to conduct a series of mixed-mode fracture experiments. Crack opening interferometry, atomic force microscopy, and angle-resolved X-ray photoelectron spectroscopy allowed cohesive zone sizes, fracture surface topographies, and loci of fracture...