...R. Parker Eason; Andrew J. Dick Displacement measurement in atomic force microscopy (AFM) is most commonly obtained indirectly by measuring the slope of the AFM probe and applying a calibration factor. Static calibration techniques operate on the assumption that the probe response approximates...

... Microscopy Systems, and (II) Atomic Force Microscopy Systems. A brief overview of these papers is provided next. The paper authored by Clayton et al. provides a comprehensive review of feedforward control approaches in nanoscale precision positioning for high-speed SPM operation. This article reviews...

...Georg E. Fantner; Daniel J. Burns; Angela M. Belcher; Ivo W. Rangelow; Kamal Youcef-Toumi New developments in MEMS (microelectromechanical systems) fabrication allowed the development of new types of atomic force microscopy (AFM) sensor with integrated readout circuit and actuator built...

...Amin Salehi-Khojin; Saeid Bashash; Nader Jalili; Gary Lee Thompson; Alexey Vertegel Piezoresponse force microscopy (PFM) is an atomic force microscopy-based approach utilized for measuring local properties of piezoelectric materials. The objective of this study is to propose a practical framework...

.... Experimental results are presented to show that the AFM-imaging speed can be substantially increased. 18 06 2008 27 04 2009 06 11 2009 06 11 2009 atomic force microscopy electric current control feedforward learning (artificial intelligence) neurocontrollers position control...

.... , 2005 , “ Nanomanipulation by Atomic Force Microscopy ,” Adv. Eng. Mater. 1438-1656 , 7 ( 4 ), pp. 193 – 196 . 10.1002/adem.200400174 Fearing , R. S. , 1995 , “ Survey of Sticking Effects for Micro Parts Handling ,” IROS ’95: Proceedings of the International Conference on Intelligent...

...) standard RC, and (3) the modified RC with phase lead compensation. The results show that the latter reduces the steady-state tracking error to less than 2% at 25 Hz scan rate, an over 80% improvement compared with PID control. 30 05 2008 22 05 2009 30 10 2009 atomic force microscopy...

... nonuniform, so the models upon which dynamic calibration is based may not be appropriate for this probe. 15 05 2008 07 05 2009 30 10 2009 atomic force microscopy beams (structures) calibration cantilevers displacement measurement elastic constants error analysis Q-factor...

... 03 2008 01 08 2008 adhesion atomic force microscopy design engineering errors flexible structures force measurement oscillations piezoelectric actuators position control tracking In this article, we study two issues encountered in the design and track of scan...

... received by the ASME Dynamic Systems and Control Division December 9, 2003. Associate Editor: E. Misawa. 09 December 2003 03 12 2004 reduced order systems atomic force microscopy molecular biophysics proteins numerical analysis nonlinear dynamical systems linear systems...

... for Detecting Force Gradients in Atomic Force Microscopy ,” Jpn. J. Appl. Phys., Part 1 0021-4922 10.1143/JJAP.33.334 , 33 , pp. 334 – 340 . Ashhab , M. , Salapaka , M. V. , Dahleh , M. , and Mezic , I. , 1999 , “ Dynamical Analysis and Control of Microcantilever ,” Automatica...

... in the ASME JOURNAL OF DYNAMIC SYSTEMS, MEASUREMENT, AND CONTROL . Manuscript received by the ASME Dynamic Systems and Control Division May 13, 2003; final revision, October 23, 2003. Associate Editor: R. Gao. 13 May 2003 23 October 2003 05 08 2004 atomic force microscopy...

... OF DYNAMIC SYSTEMS, MEASUREMENT, AND CONTROL . Manuscript received by the Dynamic Systems and Control Division November 19, 1999. Associate Editor: T. Kurfess. 19 November 1999 atomic force microscopy piezoelectric actuators creep compensation micropositioning elastic hysteresis...

... 30, 1998. Associated Technical Editor: N. O. Olgac. 30 January 1998 atomic force microscopy scanning probe microscopy Lennard-Jones potential chaos control systems intermolecular forces In recent years, several important research directions have been created to design...