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Keywords: scanning probe microscopy
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Journal Articles
Publisher: ASME
Article Type: Guest Editorial
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 060301.
Published Online: November 10, 2009
...Nader Jalili; Laxman Saggere; Arvind Raman 10 11 2009 10 11 2009 atomic force microscopy manipulators nanoelectromechanical devices scanning probe microscopy Most of today's emerging nanotechnological applications such as nanoelectromechanical systems require...
Journal Articles
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061101.
Published Online: October 28, 2009
... operating speed motivates the development of control techniques that enable high-bandwidth nanopositioning in SPMs. feedforward iterative methods nanopositioning robust control scanning probe microscopy 06 02 2008 28 04 2009 28 10 2009 Inverse-hysteresis iterative...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Dyn. Sys., Meas., Control. May 2008, 130(3): 031008.
Published Online: April 25, 2008
.... The controller is experimentally implemented on a three-dimensional nanopositioning stage for surface topography tracking, a problem typically encountered in scanning probe microscopy applications. After hitting an internal turning point, its associated minor hysteresis loop is no longer useful...
Journal Articles