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Issues
December 2018
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Review Article
Review of Thermal Packaging Technologies for Automotive Power Electronics for Traction Purposes
J. Electron. Packag. December 2018, 140(4): 040801.
doi: https://doi.org/10.1115/1.4040828
Topics:
Cooling
,
Electronics
,
Packaging
,
Temperature
,
Silicon
,
High temperature
,
Heat
Technological Advances to Maximize Solar Collector Energy Output: A Review
Swapnil S. Salvi, Vishal Bhalla, Robert A. Taylor, Vikrant Khullar, Todd P. Otanicar, Patrick E. Phelan, Himanshu Tyagi
J. Electron. Packag. December 2018, 140(4): 040802.
doi: https://doi.org/10.1115/1.4041219
Topics:
Coatings
,
Solar collectors
,
Solar energy
Research Papers
Regional Stiffness Reduction Using Lamina Emergent Torsional Joints for Flexible Printed Circuit Board Design
J. Electron. Packag. December 2018, 140(4): 041001.
doi: https://doi.org/10.1115/1.4040552
Topics:
Design
,
Hinges
,
Printed circuit boards
,
Stiffness
,
Stress
,
Deflection
,
Finite element analysis
,
Engineering prototypes
,
Materials properties
Power and Thermal Constraints-Driven Modeling and Optimization for Through Silicon Via-Based Power Distribution Network
J. Electron. Packag. December 2018, 140(4): 041002.
doi: https://doi.org/10.1115/1.4040670
Topics:
Density
,
Design
,
Heat
,
Modeling
,
Optimization
,
Silicon
,
Temperature
,
Simulation
,
Energy dissipation
,
Gates (Closures)
Reliability Analysis of Lead-Free Solders in Electronic Packaging Using a Novel Surrogate Model and Kriging Concept
J. Electron. Packag. December 2018, 140(4): 041003.
doi: https://doi.org/10.1115/1.4040924
Topics:
Failure
,
Finite element analysis
,
Modeling
,
Reliability
,
Solders
,
Thermomechanics
,
Lead-free solders
,
Electronic packaging
,
Uncertainty
,
Stress
Accelerated Vibration Reliability Testing of Electronic Assemblies Using Sine Dwell With Resonance Tracking
J. Electron. Packag. December 2018, 140(4): 041004.
doi: https://doi.org/10.1115/1.4040923
Topics:
Deflection
,
Failure
,
Failure analysis
,
Finite element analysis
,
Finite element model
,
Manufacturing
,
Reliability
,
Resonance
,
Solder joints
,
Solders
Correlation of Warpage Distribution With the Material Property Scattering for Warpage Range Prediction of PBGA Components
J. Electron. Packag. December 2018, 140(4): 041005.
doi: https://doi.org/10.1115/1.4041064
Reactive Joining of Thermally and Mechanically Sensitive Materials
Bastian Rheingans, Roman Furrer, Jürg Neuenschwander, Irina Spies, Axel Schumacher, Stephan Knappmann, Lars P. H. Jeurgens, Jolanta Janczak-Rusch
J. Electron. Packag. December 2018, 140(4): 041006.
doi: https://doi.org/10.1115/1.4040978
Topics:
Borosilicate glasses
,
Joining
,
Solders
,
Soldering
,
Tin
,
Aluminum
,
Heat
,
Temperature
,
Glass
,
Thermal shock
Assessment of Elastic–Plastic and Electrical Properties of Printed Silver-Based Interconnects for Flexible Electronics
J. Electron. Packag. December 2018, 140(4): 041007.
doi: https://doi.org/10.1115/1.4041014
Topics:
Dimensional analysis
,
Electrical properties
,
Finite element analysis
,
Flexible electronics
,
Inks
,
Modeling
,
Plasticity
,
Silver
,
Simulation
,
Stress
Error Reduction in Infrared Thermography by Multiframe Super-Resolution
J. Electron. Packag. December 2018, 140(4): 041008.
doi: https://doi.org/10.1115/1.4041360
Topics:
Emissivity
,
Errors
,
Resolution (Optics)
,
Temperature
,
Thermography
,
Uncertainty
Technical Brief
Diagonal Mode van der Pauw Stress Sensors: Proof of Diagonal-Mode Conjecture
J. Electron. Packag. December 2018, 140(4): 044501.
doi: https://doi.org/10.1115/1.4040829
Micro Copper Pillar Interconnection Using Thermosonic Flip Chip Bonding
J. Electron. Packag. December 2018, 140(4): 044502.
doi: https://doi.org/10.1115/1.4040794
Topics:
Bonding
,
Columns (Structural)
,
Flip-chip
,
Copper
,
Flip-chip devices
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Optimization of Micro-Pillars Electroplating Bonding Processes and Additives
J. Electron. Packag
Microbead Encapsulation for Protection of Electronic Components
J. Electron. Packag
Performance Analysis of a Brazed Plate Heat Exchanger During Condensation of R1233zd(E)
J. Electron. Packag (June 2025)
Wideband Equivalent Circuit Modeling and Parameter Extraction Method for Through Via in Ceramic Package Substrate
J. Electron. Packag (June 2025)