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Keywords: atomic force microscopy
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Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. August 2009, 131(8): 081902.
Published Online: June 5, 2009
...R. Kathiravan; Ravi Kumar; Akhilesh Gupta; Ramesh Chandra Copper nanoparticles with an average size of 10 nm are prepared by the sputtering method and are characterized using different techniques, viz., X-ray diffraction spectrum, atomic force microscopy, and transmission electron microscopy...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. August 2008, 130(8): 082403.
Published Online: May 30, 2008
... boundaries heat transfer metallic thin films scanning electron microscopy suspensions thermal conductivity thermal expansion thermomechanical treatment Wiedemann effect thermal conductivity metallic thin films size effects surface scattering atomic force microscopy Thermal...
Journal Articles
Publisher: ASME
Article Type: Technical Briefs
J. Heat Mass Transfer. August 2007, 129(8): 1096–1099.
Published Online: March 5, 2007
... model, which accounts for many important factors, including filler aspect ratio and maximum packing fraction. In this work, the aspect ratio was determined by atomic force microscopy (AFM) and used as an input parameter in the Nielsen model. We obtained good agreement between our results...
Journal Articles
Publisher: ASME
Article Type: Technical Briefs
J. Heat Mass Transfer. November 2007, 129(11): 1600–1604.
Published Online: January 15, 2007
.... , and Kenny , T. W. , 1999 , “ Ultrahigh-Density Atomic Force Microscopy Data Storage With Erase Capability ,” Appl. Phys. Lett. 0003-6951 10.1063/1.123540 , 76 , pp. 1329 – 1331 . Chui , B. W. , Stowe , T. D. , Ju , Y. S. , Goodson , K. E. , Kenny , T. W. , Mamin...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Heat Mass Transfer. January 2007, 129(1): 53–59.
Published Online: May 26, 2006
... photoionisation atomic force microscopy scanning electron microscopy femtosecond ablation microsphere irradiation surface modification near field effects In the field of optoelectronics and micro-electronics fused quartz and related silicate glasses are very important materials due...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. December 2004, 126(6): 985–993.
Published Online: January 26, 2005
... optics approximation 8 10 . These approximations are only appropriate within certain ranges of roughness and wavelength. Properties Radiation Roughness Scattering Surface silicon reflectivity atomic force microscopy Gaussian distribution elemental semiconductors rough surfaces...
Journal Articles
Publisher: ASME
Article Type: Heat Transfer Photogallery
J. Heat Mass Transfer. August 2002, 124(4): 597.
Published Online: August 1, 2002
...William P. King; Kenneth E. Goodson 16 07 2002 atomic force microscopy nanostructured materials imaging polymers thermal resistance Journal of Heat Transfer AUGUST 2002, Vol. 124 Õ 597 2002 ASME ...
Journal Articles
Publisher: ASME
Article Type: Heat Transfer Photogallery
J. Heat Mass Transfer. August 2002, 124(4): 593–600.
Published Online: July 16, 2002
...K. D. Kihm 16 07 2002 heat transfer flow visualisation photography fluorescence stratified flow atomic force microscopy light interferometry infrared imaging The sixth “Heat Transfer Photogallery” was sponsored by the K-22 Heat Transfer Visualization Committee...
Journal Articles
Publisher: ASME
Article Type: Heat Transfer Photogallery
J. Heat Mass Transfer. August 2001, 123(4): 619.
Published Online: August 1, 2001
...Tai-Hsi Fan and; Andrei Fedorov atomic force microscopy data visualisation molecular dynamics method digital simulation A computer visualization method is used to present the details of the imaging action by the surface scanning equipment—Atomic Force Microscope (AFM) from...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Heat Mass Transfer. April 2002, 124(2): 329–337.
Published Online: July 27, 2001
... received July 27, 2001. Associate Editor: D. Poulikakos. point contacts heat transfer thermal conductivity atomic force microscopy temperature sensors Contact Resistance Heat Transfer Microscale Nanoscale Probes The continuous scaling of semiconductor devices has produced...