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Mark R. Davies
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Proceedings Papers

Microchannel Fluorescent Melting Curve Analysis

David J. Kinahan, Tara M. Dalton, Mark R. Davies
Proc. ASME. ICNMM2008, ASME 2008 6th International Conference on Nanochannels, Microchannels, and Minichannels, 1579-1585, June 23–25, 2008
Publisher: American Society of Mechanical Engineers
Paper No: ICNMM2008-62014
https://doi.org/10.1115/ICNMM2008-62014
View Paper titled, Microchannel Fluorescent Melting Curve Analysis
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Topics: Melting, Microchannels, Microfluidics, DNA, Drops, Flow (Dynamics), Mineral oil, Temperature, Temperature gradient
Proceedings Papers

Thermal Resistance Measurements From a Microchannel Fluorescent Melting Curve Analysis Platform

David J. Kinahan, Tara M. Dalton, Mark R. Davies
Proc. ASME. ICNMM2008, ASME 2008 6th International Conference on Nanochannels, Microchannels, and Minichannels, 489-498, June 23–25, 2008
Publisher: American Society of Mechanical Engineers
Paper No: ICNMM2008-62015
https://doi.org/10.1115/ICNMM2008-62015
View Paper titled, Thermal Resistance Measurements From a Microchannel Fluorescent Melting Curve Analysis Platform
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Topics: Melting, Microchannels, Thermal resistance, Flow (Dynamics), Temperature gradient, Tubing, Fluids, Heat transfer, Temperature, Computer simulation
Proceedings Papers

Experimental Study of Local Mass Transfer From a Flat Plate in Uniform Flow Using Electronic Speckle Pattern Interferometry

Tara M. Dalton, David McGuire, Mark R. Davies
Proc. ASME. HT-FED2004, Volume 1, 413-420, July 11–15, 2004
Publisher: American Society of Mechanical Engineers
Paper No: HT-FED2004-56605
https://doi.org/10.1115/HT-FED2004-56605
View Paper titled, Experimental Study of Local Mass Transfer From a Flat Plate in Uniform Flow Using Electronic Speckle Pattern Interferometry
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Topics: Electronic speckle pattern interferometry, Flat plates, Flow (Dynamics), Mass transfer, Air flow, Ethanol, Fluids, Reynolds number, Algorithms, Chemical reactions
Proceedings Papers

Development of an Electronic Speckle Pattern Interferometer for Measurement of Concentration Gradients in a Binary Mixture

David McGuire, Julie Garvey, Tara M. Dalton, Mark R. Davies
Proc. ASME. HT-FED2004, Volume 1, 407-412, July 11–15, 2004
Publisher: American Society of Mechanical Engineers
Paper No: HT-FED2004-56604
https://doi.org/10.1115/HT-FED2004-56604
View Paper titled, Development of an Electronic Speckle Pattern Interferometer for Measurement of Concentration Gradients in a Binary Mixture
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Topics: Interferometers, Algorithms, Construction, Electronic speckle pattern interferometry
Proceedings Papers

Real-Time Fluorescence Monitoring of the Polymerase Chain Reaction in a Novel Continuous Flow Reactor for Accurate DNA Quantification

Michael B. Sayers, Tara M. Dalton, Mark R. Davies
Proc. ASME. ICNMM2006, ASME 4th International Conference on Nanochannels, Microchannels, and Minichannels, Parts A and B, 1045-1051, June 19–21, 2006
Publisher: American Society of Mechanical Engineers
Paper No: ICNMM2006-96179
https://doi.org/10.1115/ICNMM2006-96179
View Paper titled, Real-Time Fluorescence Monitoring of the Polymerase Chain Reaction in a Novel Continuous Flow Reactor for Accurate DNA Quantification
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Topics: Chain, DNA, Flow (Dynamics), Fluorescence, Tubing, Cycles, Temperature, Aluminum, Annealing, Biocompatibility
Proceedings Papers

Investigative Study of Local Sherwood Numbers Using Phase Measurement Interferometry

David McGuire, Tara M. Dalton, Mark R. Davies
Proc. ASME. IMECE2004, Fluids Engineering, 513-520, November 13–19, 2004
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2004-59772
https://doi.org/10.1115/IMECE2004-59772
View Paper titled, Investigative Study of Local Sherwood Numbers Using Phase Measurement Interferometry
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Topics: Air flow, Algorithms, Boundary layers, Chemical reactions, Corrosion, Design, Diffusion (Physics), Electronic speckle pattern interferometry, Ethanol, Evaporation
Proceedings Papers

Using Electric Speckle Pattern Interferometry (ESPI) for the Measurement of Concentration Profiles Within a Binary Mixture

David C. McGuire, Tara M. Dalton, Mark R. Davies
Proc. ASME. IMECE2004, Fluids Engineering, 521-526, November 13–19, 2004
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2004-59775
https://doi.org/10.1115/IMECE2004-59775
View Paper titled, Using Electric Speckle Pattern Interferometry (ESPI) for the Measurement of Concentration Profiles Within a Binary Mixture
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Topics: Electronic speckle pattern interferometry, Interferometry, Interferometers, Fluids, Algorithms, Construction, Mass transfer, Optics
Proceedings Papers

Fluorescent Melting Curve Analysis Compatible With a Flowing Polymerase Chain Reactor

Tara M. Dalton, David J. Kinahan, Mark R. Davies
Proc. ASME. IMECE2005, Advances in Bioengineering, 31-36, November 5–11, 2005
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2005-80954
https://doi.org/10.1115/IMECE2005-80954
View Paper titled, Fluorescent Melting Curve Analysis Compatible With a Flowing Polymerase Chain Reactor
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Topics: Chain, Melting, DNA, Temperature, Flow (Dynamics), Fluorescence, Microchannels
Journal Articles

An Experimental Assessment of Numerical Predictive Accuracy for Electronic Component Heat Transfer in Forced Convection—Part II: Results and Discussion

Peter J. Rodgers, Vale´rie C. Eveloy, Mark R. Davies
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Technical Papers
J. Electron. Packag. March 2003, 125(1): 76–83.
https://doi.org/10.1115/1.1533060
Published Online: March 14, 2003
View Article titled, An Experimental Assessment of Numerical Predictive Accuracy for Electronic Component Heat Transfer in Forced Convection—Part II: Results and Discussion
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Topics: Computer software, Flow (Dynamics), Forced convection, Heat transfer, Junctions, Modeling, Temperature, Thermal conductivity, Errors, Computational fluid dynamics
Journal Articles

Forced Convection Board Level Thermal Design Methodology for Electronic Systems

Reena Cole, Tara Dalton, Jeff Punch, Mark R. Davies, Ronan Grimes
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Technical Papers
J. Electron. Packag. June 2001, 123(2): 120–126.
https://doi.org/10.1115/1.1339822
Published Online: July 21, 2000
View Article titled, Forced Convection Board Level Thermal Design Methodology for Electronic Systems
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Topics: Design, Design methodology, Electronic systems, Flow (Dynamics), Forced convection, Temperature, Thermal resistance, Junctions, Reynolds number, Reliability