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Tatsuya Fujii
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Proceedings Papers

Effects of Alpha-Cellulose Supply on the Working Life of MCF Slurry in MCF Polishing

Yuta Nonaka, Mitsuyoshi Nomura, Tatsuya Fujii, Tsunehisa Suzuki, Yongbo Wu
Proc. ASME. LEMP2020, JSME 2020 Conference on Leading Edge Manufacturing/Materials and Processing, V001T03A015, September 3, 2020
Paper No: LEMP2020-8568
DOI: https://doi.org/10.1115/LEMP2020-8568
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Topics: Fluids, Polishing, Slurries
Proceedings Papers

Effects of Cold Air Supply on Cutting Characteristics in Small Hole Drilling of PEEK

Shogo Ito, Mitsuyoshi Nomura, Tatsuya Fujii, Tsunehisa Suzuki
Proc. ASME. LEMP2020, JSME 2020 Conference on Leading Edge Manufacturing/Materials and Processing, V001T03A016, September 3, 2020
Paper No: LEMP2020-8569
DOI: https://doi.org/10.1115/LEMP2020-8569
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Topics: Cooling, Cutting, Drilling, Heat
Journal Articles

Fundamental Machining Characteristics of Ultrasonic-Assisted Electrochemical Grinding of Ti–6Al–4V

Sisi Li, Yongbo Wu, Mitsuyoshi Nomura, Tatsuya Fujii
Journal: Journal of Manufacturing Science and Engineering
Article Type: Research-Article
J. Manuf. Sci. Eng. July 2018, 140(7): 071009.
Paper No: MANU-17-1160
DOI: https://doi.org/10.1115/1.4039855
Published Online: May 11, 2018
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Topics: Grinding, Machining, Wheels, Wear, Grinding wheels
Proceedings Papers

Influences of Specimen Size and Annealing Temperature on Mechanical Reliability of FIB-Fabricated Si Nanowires for NEMS

Tatsuya Fujii, Koichi Sudoh, Shozo Inoue, Takahiro Namazu
Proc. ASME. InterPACK2013, Volume 1: Advanced Packaging; Emerging Technologies; Modeling and Simulation; Multi-Physics Based Reliability; MEMS and NEMS; Materials and Processes, V001T06A006, July 16–18, 2013
Paper No: IPACK2013-73310
DOI: https://doi.org/10.1115/IPACK2013-73310
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Topics: Annealing, Nanoelectromechanical systems, Nanowires, Reliability, Temperature, Manufacturing, Silicon, Young's modulus, Damage, Focused ion beams
Journal Articles

Focused Ion Beam Induced Surface Damage Effect on the Mechanical Properties of Silicon Nanowires

Tatsuya Fujii, Takahiro Namazu, Koichi Sudoh, Shouichi Sakakihara, Shozo Inoue
Journal: Journal of Engineering Materials and Technology
Article Type: Research-Article
J. Eng. Mater. Technol. October 2013, 135(4): 041002.
Paper No: MATS-13-1017
DOI: https://doi.org/10.1115/1.4024545
Published Online: June 10, 2013
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Topics: Damage, Focused ion beams, Fracture toughness, Manufacturing, Mechanical properties, Membranes, Nanowires, Silicon, Young's modulus, Size effect