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Wan Kyun Chung
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Proceedings Papers

Proc. ASME. IDETC-CIE2007, Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference, 31-39, September 4–7, 2007
Publisher: American Society of Mechanical Engineers
Paper No: DETC2007-34701
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